电子科技大学：《集成电路可测性设计 VLSIDesign》课程教学资源（课件讲稿）第11章 存储器测试

● ●● 故障和失效 ●●●● ●●● Failure-Incorrect or interrupted system behavior 。Error-Manifestation(表现)of fault in system Fault-Physical difference between good bad system behavior 2021/8/18 集成电路可测性设计 17

2021/8/18 集成电路可测性设计 17  Failure-Incorrect or interrupted system behavior  Error-Manifestation（表现）of fault in system  Fault-Physical difference between good & bad system behavior 故障和失效

●● 故障类型 ●● ●● ●●⊙@ 。Permanent./永久-System is broken and stays broken the same way indefinitely ●Transient./瞬时-Fault temporarily affects the system behavior,and then the system reverts to the good machine--time dependency,caused by environmental condition 。Intermittent/间歇-Sometimes causes a failure,sometimes does not 2021/8/18 集成电路可测性设计 18

2021/8/18 集成电路可测性设计 18  Permanent / 永久 -- System is broken and stays broken the same way indefinitely  Transient / 瞬时 -- Fault temporarily affects the system behavior, and then the system reverts to the good machine -- time dependency, caused by environmental condition  Intermittent / 间歇 -- Sometimes causes a failure, sometimes does not 故障类型

●● 失效机制 ●●●● ●●●● ●Permanent faults/永久故障： Missing/Added Electrical Connection Broken Component (IC mask defect or silicon- to-metal connection) Burnt-out Chip Wire Corroded connection between chip package Chip logic error(Pentium division bug) 2021/8/18 集成电路可测性设计 19

2021/8/18 集成电路可测性设计 19  Permanent faults / 永久故障:  Missing/Added Electrical Connection  Broken Component (IC mask defect or silicon￾to-metal connection)  Burnt-out Chip Wire  Corroded connection between chip & package  Chip logic error (Pentium division bug) 失效机制

● 失效机制（续） ●●●● ●●@ Transient Faults/瞬时故障： >Cosmic Ray/宇宙射线 >An a particle(ionized Helium atom电离氦原子) Air pollution(causes wire short/open) Humidity (temporary short) Temperature (temporary logic error) Pressure (temporary wire open/short) >Vibration/振动(temporary wire open) >Power Supply Fluctuation波动(logic error) > Electromagnetic Interference(coupling) > Static Electrical Discharge:静电放电(change state) Ground Loop(misinterpreted曲解的logic value) 2021/8/18 集成电路可测性设计 20

2021/8/18 集成电路可测性设计 20  Transient Faults / 瞬时故障:  Cosmic Ray / 宇宙射线  An a particle (ionized Helium atom电离氦原子)  Air pollution (causes wire short/open)  Humidity (temporary short)  Temperature (temporary logic error)  Pressure (temporary wire open/short)  Vibration / 振动 (temporary wire open)  Power Supply Fluctuation波动 (logic error)  Electromagnetic Interference (coupling)  Static Electrical Discharge静电放电 (change state)  Ground Loop (misinterpreted曲解的 logic value) 失效机制（续）

●0 失效机制（续） ●● ●● ●●@ ●Intermittent Faults/间歇故障： Loose Connections Aging Components(changed logic delays) Hazards and Races in critical timing paths(bad design) > Resistor,Capacitor,Inductor variances(timing faults) Physical Irregularities(narrow wire--high resistance) Electrical Noise (memory state changes) 2021/8/18 集成电路可测性设计 21

2021/8/18 集成电路可测性设计 21  Intermittent Faults / 间歇故障:  Loose Connections  Aging Components (changed logic delays)  Hazards and Races in critical timing paths (bad design)  Resistor, Capacitor, Inductor variances (timing faults)  Physical Irregularities (narrow wire -- high resistance)  Electrical Noise (memory state changes) 失效机制（续）