●● ●●●● ●● 第九章内建自测试(BST) 利用第八章“伪随机测试”的部分知识 2021/8/18 集成电路可测性设计 2
2021/8/18 集成电路可测性设计 2 第九章 内建自测试(BIST） 利用第八章“伪随机测试”的部分知识
●●● ●● ●●●● 本章要点 ●●●● ●●●● 。理解BIST的原理 。掌握LFSR的原理 ●掌握BIST的结构 2021/8/18 集成电路可测性设计 3
2021/8/18 集成电路可测性设计 3 本章要点 理解BIST的原理 掌握LFSR的原理 掌握BIST的结构
●●●● ●● ●●●● ●●●● ●●0● ●●o● ● 1、BST概述 2021/8/18 集成电路可测性设计 4
2021/8/18 集成电路可测性设计 4 1、BIST概述
●●● ●● ● ●●0 BIST概述 ●●●● ●Built--in Self-.Test的概念 Test Generator 通俗的解释： Circuit Under Test 把ATE的功能 (CUT) 搬到了芯片内部 Response Compressor 2021/8/18 集成电路可测性设计 5
2021/8/18 集成电路可测性设计 5 BIST概述 Built-in Self-Test的概念 Test Generator Circuit Under Test (CUT) Response Compressor 通俗的解释： 把ATE的功能 搬到了芯片内部
●0 BIST的目标 ●● ●●@ Reduce input/output pin signal traffic. Permit easy circuit initialization and observation. Eliminate as much test pattern generation as possible. Achieve fair fault coverages on general class of failure mode. ●Reduce test time. Execute at-speed testing. Test circuit during burn-in. BIST Goal 2021/8/18 集成电路可测性设计 6
2021/8/18 集成电路可测性设计 6 BIST 的目标 Reduce input/output pin signal traffic. Permit easy circuit initialization and observation. Eliminate as much test pattern generation as possible. Achieve fair fault coverages on general class of failure mode. Reduce test time. Execute at-speed testing. Test circuit during burn-in. BIST Goal