●● ●0 ● ●● BIST的优点 ●●●● ● Can be used at all level of testing System level testing in field ●At speed testing ●No need for ATE Less 1/O pins needed for testing Burn-in Test made easy No need for test vector development 2021/8/18 集成电路可测性设计 7
2021/8/18 集成电路可测性设计 7 BIST的优点 Can be used at all level of testing System level testing in field At speed testing No need for ATE Less I/O pins needed for testing Burn-in Test made easy No need for test vector development
●● ● ●● BIST的缺点 ●●●● ●●●● .Area overhead -more susceptibility to manufacturing defects Performance penalties Designing and verifying proper operation of BIST at design level. Additional risk in project 2021/8/18 集成电路可测性设计 8
2021/8/18 集成电路可测性设计 8 BIST的缺点 Area overhead -more susceptibility to manufacturing defects Performance penalties Designing and verifying proper operation of BIST at design level. Additional risk in project
●● ●0 ● ●●0 BIST分类 ●●●● ●●●● 。通常分为 。LBIST ·Logic BIST-研究很深入，但是应用很少 ●MBIST 。Memory BIST--极大的应用 ·Syntest公司 本章重点 ·SRAM BIST ●Mentor公司 ·MBIST ● Synopsys公司 ▣？？ 2021/8/18 集成电路可测性设计 9
2021/8/18 集成电路可测性设计 9 BIST分类 通常分为 LBIST Logic BIST---研究很深入，但是应用很少 MBIST Memory BIST---极大的应用 Syntest公司 SRAM BIST Mentor公司 MBIST Synopsys公司 ？？ 本章重点
●● ●●● ●●●● ● ●●●●0 MBIST构成 ●●● ● ● Origihal memory port mem ctl BIST Controller Memory wrapper BistMbde bist ctrl Finish 渔 BistFail EnMap 2021/8/18 集成电路可测性设计 10
2021/8/18 集成电路可测性设计 10 MBIST构成
●● ●●● ●●●● ●● ●●●●0 MBIST构成 ●●●● ●●● ● Original Memory Control From BIST Original Address From BIST Original Data In From BIST BistMode Memory Wrapper 2021/8/18 集成电路可测性设计 11
2021/8/18 集成电路可测性设计 11 MBIST构成 Memory Wrapper