2.1针床测试仪概念 Device Under Fixture Test Wiring Fixture Probe (nail) PC Board Under Test -----Hfest System Actual Receive Pass/Fail States 0-Pass R2 1-Fail D3 Pass/Fail Expected年 Receive States Drive States 2020/9/5 集成电路可测性设计 7
2.1 针床测试仪概念 2020/9/5 集成电路可测性设计 7
2.2针床测试仪 Precision Board Under Test Tooling Gasket Pin 图 Test Probe Piaten (naif) Fixture Personafity Wire Pn、 Tester Removable Interface Alignment Pins Plate Test Electronics 2020/9/5 集成电路可测性设计 8
2.2 针床测试仪 2020/9/5 集成电路可测性设计 8
3、边界扫描硬件系统 子科发女学 1/966 University of Electronic Science and Technology of China
3、边界扫描硬件系统
3.1起源 起源1985 -电路测试的DFT方法 -为了测试电路板上IC之间的连通性 欧洲1985：联合测试行动组一JTAG USA1990:IEEE1149.1标准 目前得到广泛应用 2020/9/5 集成电路可测性设计 10
3.1 起源 起源1985 电路板测试的DFT方法 为了测试电路板上IC之间的连通性 欧洲1985: 联合测试行动组－JTAG USA1990: IEEE 1149.1 标准 目前得到广泛应用 2020/9/5 集成电路可测性设计 10
Overview of P1149 Family Number e Status 1149.1 Testing of digital chips and Sd1149.1-1990 interconnections between Sd1149.1a1993 chips Std1149.1b-1994BSD) 1149.2 Extended Digital Serial Near completion Interface 1149.3 Direct Access Testability Discontinue interface 1149.4 Mixed-Signal Test Bus Started Nov.1991 1149.5 Standard Module Test and Std 1149.5-1995 Maintenance (MTM Bus Protocal 1149 Unification Not yet started 2020/9/5 集成电路可测性设计 11
Number Title Status 1149.1 Testing of digital chips and interconnections between chips Std. 1149.1-1990 Std. 1149.1a-1993 Std. 1149.1b-1994 (BSDL) 1149.2 Extended Digital Serial Interface Near completion 1149.3 Direct Access Testability interface Discontinue 1149.4 Mixed-Signal Test Bus Started Nov. 1991 1149.5 Standard Module Test and Maintenance (MTM) Bus Protocal Std. 1149.5-1995 1149 Unification Not yet started 2020/9/5 集成电路可测性设计 11 Overview of P1149 Family