宽带滤波片 窄带滤波片 辐射源 石英玻璃观测窗 成像透镜 像增強器CCD系统
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D, CAEP-200 NANO CAMERA SHOWS STAGES OF Z-PINCH HISTORY 圃耋 -10n OUTER BORDER OUTER BORDER DEEP WIRES SUBSTANCE APPROXIMATELY DEFORMATION HAS DEFORMED. DEFORMATION OF IS COMPRESSED MAXIMUM OF X-RAY BEGINNING INTERNAL OUTER BORDER. ONTO ARRAY AXES. EMISSION. ARRAY WIRES THERE ARE NO SUBSTANCE IS SUBSTANCE IS HAS NOT SEEN WIRE PRESENTED ON PRESENTED ON DESTURBED TRACES INITIALBORDER INITIAL BORDER POSITION POSITION OUTERARRAY THE PROFILE OF THE DEFORMED OUTER SURFACE BORDER ALLOW TO ESTIMATE DENSITY d PERTURBATING OF PLASMA ON AN EXTERNAL BORDER STARTED POSITION 1-2·10-g/cn △ d~△~0.5mm R=Ro
d d R=R0 NANO CAMERA SHOWS STAGES OF Z-PINCH HISTORY THE PROFILE OF THE DEFORMED OUTER BORDER ALLOW TO ESTIMATE DENSITY d OF PLASMA ON AN EXTERNAL BORDER POSITION. ρ 1-2·10-4 g/cm3 OUTER BORDER DEFORMATION BEGINNING OUTER BORDER HAS DEFORMED. INTERNAL ARRAY WIRES HAS NOT DESTURBED DEEP DEFORMATION OF OUTER BORDER. THERE ARE NO SEEN WIRE TRACES WIRES SUBSTANCE IS COMPRESSED ONTO ARRAY AXES. SUBSTANCE IS PRESENTED ON INITIALBORDER POSITION APPROXIMATELY MAXIMUM OF X-RAY EMISSION. SUBSTANCE IS PRESENTED ON INITIAL BORDER POSITION KI, TRINITI (A-5-1),CAEP - 2004 OUTER ARRAY SURFACE PERTURBATING STARTED d ~ Δ~0.5mm -80 ns -60 ns -40 ns -10 ns -4 ns