图 照相法 (3)针孔法 透射法=[arctan(r/D)]V2 反射法0=[180°-arctan(r/D)]/2 底片 单色光→多晶 白光→单晶(Laue Method) 28 282 光栏 试 小件件子习L任子元 School of Materials Science and Engineering
材料科学与工程学院 School of Materials Science and Engineering 照相法 透射法 θ=[arctan(r/D)]/2 (3) 针孔法 反射法 θ=[180o - arctan(r/D)] /2 单色光→多晶 白光→单晶（Laue Method)
© X射线衍射仪 X'Per Detector Receiving slit Soller slit Monochromator 20 Anti scatter slit X-ray tube Soller slits (line focus) Sample Divergence slit Measuring circle
材料科学与工程学院 School of Materials Science and Engineering X射线衍射仪
图 X射线衍射仪 Detector 扫描方式 Receiving slit Soller slit ▣偶合扫描 Monochromator 26 Anti scatter slit √0-20 D X-ray tube Soller slits (line focus) √0-0 Sample Divergence slit Measuring circle Detector Mon chromator Divergence slit Antiscatter slit F D Detector 生0 X-ray slit source Sample
材料科学与工程学院 School of Materials Science and Engineering X射线衍射仪 扫描方式 偶合扫描 θ -2θ θ -θ
③ 偶合扫描 0-20连动 0-0连动 28 8 28 20 材料科学与工程学院 School of Materials Science and Engineering
材料科学与工程学院 School of Materials Science and Engineering 偶合扫描
周 Bragg-Brentano geometry Goniometer circle Focusing circle RS D RS RS DS 20 20 0-20 mode 0-0 mode 20 F 0 School of Materials Science and Engineering
材料科学与工程学院 School of Materials Science and Engineering Bragg-Brentano geometry -2 mode - mode