Adhesion mode Material Characterization No.2 Nylon66/PPE SII O eiko Instruments Inc Island. nylon66 Sea.. PPE Topography Friction force Visco-Elasticity Adhesion Hygro-absorption difference is reflected in the adhesion image. There is little difference in their hardness. which is reflected in the ve AFM image It is presumed that phase image of this sample is largely affected by the adhesion Same as Topogra phy Phase friction force
Hygro-absorption difference is reflected in the adhesion image. There is little difference in their hardness, which is reflected in the VEAFM image. It is presumed that phase image of this sample is largely affected by the adhesion. Same as Topography Phase friction force. Topography Friction Force Island…nylon66 Sea…ＰＰＥ Visco-Elasticity Adhesion Adhesion mode Material Characterization No.2 Nylon66/PPE
Material Characterization using SPM Nanoindentation(mechanical test system) SII C Seiko Instruments Inc TriboScope Nanomechanical Test Instruments with SPA-400/SPA-300HV PURPOSE 1. NanoIndentation With AfM, surface images of thin films before and after indentation is available Hardness and elasticity is also available 2. Micro scratch Continuous data, depth of scratch and load, is available Useful for analyzing stickiness of ultra-thin film. Indent data(AFM image) 3. Wear Testing and Micromachining Evaluating wear rate by scanning in any range under various load is realized APPLICTION DLC film, HD/Head, compound material, IC, Polymer, nano-mechanical test of insulation film etc Force/Displacement curve (A graphic chart indicating ideal repeatability of weighting) Scratch(AFM image) splacement, nm 10 nm Dlc on a head slider
TriboScope Nanomechanical Test Instruments with SPA-400/SPA-300HV APPLICTION ＤＬＣ film, HD／Head, compound material, ＩＣ, Polymer, nano-mechanical test of insulation film, etc. ＜仕 様＞ 荷重及び感度： 最大１０ｍＮ，分解能１００ｎＮ 変位及び感度： 最大５μｍ 分解能０．２ｎｍ PURPOSE １．ＮａｎｏＩｎｄｅｎｔａｔｉｏｎ With AFM, surface images of thin films before and after indentation is available. Hardness and elasticity is also available. ２．Micro scratch Continuous data, depth of scratch and load, is available. Useful for analyzing stickiness of ultra-thin film. ３．Ｗｅａｒ Ｔｅｓｔｉｎｇ ａｎｄ Ｍｉｃｒｏｍａｃｈｉｎｉｎｇ Evaluating wear rate by scanning in any range under various load is realized. 0 50 100 150 200 0 200 400 600 Force, N Displacement, nm ←Force/Displacement curve （A graphic chart indicating ideal repeatability of weighting） Indent data（AFM image） Scratch（AFM image） 10 nm DLC on a Head Slider Material Characterization using SPM Nanoindentation （mechanical test system）
Quick Cooling System SPA-300HV SII C eiko Instruments Inc Quick Cooling system 温度/一>制御 emperature range 300°c~-120°C 0 Cooling Speed 2 12 時同(mn) 180°C/ min max ”么設戽温度(℃)—实際温度(℃ In-situ observation of melting polymer is realized by controlling 凝固又-F(冷却温度一下) the solidification speed 230 20℃c/min Grain size difference 210 60℃C/min (amorphous, micro-crystallization, 90°c/min 120°c/min growth of crystal grain 180°c/min 060120180240300360 Material Characterization 時間(sec) (Visco-elasticity, friction force)
Quick Cooling System Temperature Range： ＋300℃～－120℃ Cooling Speed： 180℃／min max In-situ observation of melting polymer is realized by controlling the solidification speed. ・Grain size difference （amorphous, micro-crystallization, growth of crystal grain） ・Material Characterization （Visco-elasticity, friction force） 凝固スピ－ド（冷却温度レ－ト） 150 170 190 210 230 0 60 120 180 240 300 360 時間（ｓｅｃ） 温度（℃） ２０℃/ｍｉｎ 30℃/ｍｉｎ ６０℃/ｍｉｎ ９０℃/ｍｉｎ １２０℃/ｍｉｎ １８０℃/ｍｉｎ 温度パタ－ン制御 0 100 200 300 0 2 4 6 8 10 12 時間（ｍｉｎ） 温度（℃） プログラム 設定温度（℃） 実際 温度（℃） Quick Cooling System -SPA-300HV-
Magnetic Force Microscope SII C eiko Instruments Inc Advantage SPMimaging distribution of magnetic field of a sample surface Simultaneous observation of high resolution domain imaging with topography Image 器 M FM image of OM-disk MFM image of thin permalloy film Scan area: 1 Oum Scan area: 40um
MFM image of OM-disk MFM image of thin permalloy film Scan area ：１０μｍ Scan area ：４０μｍ ・SPM imaging distribution of magnetic field of a sample surface. ・Simultaneous observation of high resolution domain imaging with topography. Image Advantage Magnetic Force Microscope