Phase(PM: Phase Mode)measurement Structure and function of polymer SII C (SPA-300HV, Environment Control Type Unit) Data No. 2 Micro Phase Separation Structure of SBS(Phase Mode) 90°C kduferco 200nm 200nm 200nm POlystyrene phase(hard segment)and Polybutadiene phase(soft segment) is clearly separated OThe initial data indicates non-equilibrium condition, because it disappears once it is heated
Data No.２ Micro Phase Separation Structure of SBS (Phase Mode) 200 nm R.T. 200 nm 90℃ 200 nm R.T. after cooling ●Polystyrene phase (hard segment) and Polybutadiene phase (soft segment) is clearly separated ●The initial data indicates non-equilibrium condition, because it disappears once it is heated. Phase（PM：Phase Mode）measurement － Structure and Function of Polymer － （SPA-300HV, Environment Control Type Unit）
Material characterization VE-AFM/DFM(Micro Viscoelasticity Meas.) SII C eiko Instruments Inc Purpose】 Distribution of the viscoelasticity change in the polymer surface can be observed INPUT Vibration Principle Signal to PZT Detecting the amplitude and phase (1~10kHz) (Large) change of the cantilever distortion maID) OUTPUT when the cyclic force is applied v Deflection Signal of Advantage Canti lever Cantilever Simultaneous imaging with opography Material difference or distribution OUTPUT can be detected even no change in Deflect topography Signal Sample (SmaIl) (Large) Application] o Plastics, Rubber, Biological Materials
OUTPUT Deflection Signal of Cantilever INPUT Vibration Signal to PZT (1～10kHz) OUTPUT Deflection Signal of Sample (Large) (Small) PZT Cantilever （Small） （Large） Material Characterization VE-AFM/DFM（Micro Viscoelasticity Meas.） 【Purpose】 ◆Distribution of the viscoelasticity change in the polymer surface can be observed. 【Principle】 ◆ Detecting the amplitude and phase change of the cantilever distortion when the cyclic force is applied. 【Advantage】 ◆Simultaneous imaging with topography ◆Material difference or distribution can be detected even no change in topography 【Application】 ◆ Plastics, Rubber, Biological Materials
VE-AFM/DFM(Micro Viscoelasticity Measurement Mode) Observation of Glass Transition in Polymer SII C (SPA-300HV, Environment Control Type Unit) Data No. 3 Polypropylene Block Copolymer PR domain 10 10 bleck eepoly ater 10℃ 100℃ G’ErR Structure of Pp Block Copolymer 120℃ PP: Polypropylene 100 PE: Polyethylene EPR: Ethylene Propylene Rubber tano BLeck copolymer *In-situ observation is available with the temperature controlled SPM 150 150 10 *VE-data of SPA300HV is overlapped Temp /C with the data of Dynamic Mechanical Spectrometer DMs6100
Data No.３ Polypropylene Block Copolymer E’ , G’ / Pa Temp. / ℃ tanδ -150 -100 -50 0 50 100 150 10-2 10-1 100 101 103 102 1010 108 106 104 102 -100℃ -70℃ 50℃ 120℃ -10℃ E’ PP block copolymer G’ EPR tanδ PP block copolymer tanδ EPR Tg EPR ＥＰＲ domain ＰＰ matrix ＰＥ rich Structure of PP Block Copolymer PP: Polypropylene PE: Polyethylene EPR: Ethylene Propylene Rubber *In-situ observation is available with the temperature controlled SPM *VE-data of SPA300HV is overlapped with the data of Dynamic Mechanical Spectrometer DMS6100. VE-AFM/DFM（MicroViscoelasticity Measurement Mode） Observation of Glass Transition in Polymer （ SPA-300HV, Environment Control Type Unit）
Material Characterization LM-FFM (Lateral Modulation FFM) SII C Seiko Instruments Inc 【 Purpose Friction Force Microscope Lateral Modulation FFM O Mapping friction force distributed sample surface Twisting Distortion Twisting Amplitude 【 Principle 走1 (小) 走查 o Imaging lateral amplitude of a cantilever, while a sample is Small ve Large ve laterally vibrated Sm叫V Large ve 【 Advantage】 Simultaneous observation Effect Lateral modulation of topography and friction force. Valid for imaging material character distinction of a compound which does not be FFM出力 LM一FFM出力 judged from the topography Image. Twisting distortio Twisting Amplitude 【 Application ◆ Lubricant· organic compound polymer plastic rubber Sample: oil/ Polystyrene Sheet Topography(5 u m) FFM LM一FFM
【Purpose】 ◆Mapping friction force distributed sample surface. 【Principle】 ◆ Imaging lateral amplitude of a cantilever, while a sample is laterally vibrated. 【Advantage】 ◆Simultaneous observation of topography and friction force. ◆Valid for imaging material character distinction of a compound which does not be judged from the topography image. 【Application】 ◆Lubricant・organic compound・ polymer・plastic・ rubber Lateral Modulation Edge Effect Twisting distortion Twisting Amplitude Topography（5μｍ） ＦＦＭ ＬＭ－ＦＦＭ Sample : Oil/Polystyrene Sheet Material Characterization LM-FFM（Lateral Modulation FFM） Friction Force Microscope Lateral Modulation FFM Twisting Distortion Twisting Amplitude Small VE Large VE Small VE Large VE
Material Characterization using sPm Adhesion mode SII C Seiko Instruments Inc 【 Purpose iMaging distribution of local adhesion of s sample surface Equal to continuous force curb measurement of sin wave drive 【 Principle o Detecting bending of a cantilever the Principle of moment it is separated from a sample force curve surface during AFM operation, with sin measurement 习儿O移劲量 wave vibrated PzT 【 Advantage】 sImultaneous observation of to pography and adhesion on sample surface Mapping 74 bending when a Valid for imaging material character probe is distinction or distribution of a compound D铝啦 separated from which can not be identified from a sample topography 【 Application lubricant organic compound polymer. Principle of plasticrubber adhesion measurement
【Purpose】 ◆Imaging distribution of local adhesion of sample surface. Equal to continuous force curb measurement of sin wave drive. 【Principle】 ◆ Detecting bending of a cantilever the moment it is separated from a sample surfaceduring AFM operation, with sin wave vibrated PZT. 【Advantage】 ◆Simultaneous observation of topography and adhesion on sample surface ◆Valid for imaging material character distinction or distribution of a compound which can not be identified from topography 【Application】 ◆lubricant・organic compound・polymer・ plastic・rubber Principle of force curve measurement Principle of adhesion measurement Mapping bending when a probe is separated from a sample. Material Characterization using SPM Adhesion mode