TEXASSZZA036BINSTRUMENTSIntroductionToassistcomponentand system-design engineersin selectingTexas Instruments(TI)standard-logicproducts,this applicationreport is asynopsisof theinformationavailablefromatypical TI data sheet. Information includes a briefdescription of terms, definitions, and testingprocedures currentlyusedfor commercialandmilitaryspecifications.Symbols,terms,anddefinitionsgenerallyare inaccordancewiththosecurrentlyagreeduponbytheJEDECSolidStateTechnologyAssociationforuseintheUSAandbytheInternationalElectrotechnicalCommission (IEC)for international use.This application report is organized intofivemainsections1.Introduction2.Top-Level Look at the TI Data Sheet. Overall layout and component parts of a datasheet are explained.3.DissectingtheTILogicDataSheet.JEDECdefinition,theTIdefinition,anexplanation,and,wherepossible,helpfulhintsarepresentedforeachspecificationterm commonlyfoundin TI logic data sheets.4.Logic Compatibility.Information in TI logicdata sheets fordetermining theinterfacecompatibilitybetweendifferentlogicfamiliesisexplained.5.Endmatter,includingtheConclusion,Acknowledgments,andReferencessections.Top-LevelLookattheTlLogicDataSheetTheTI logic data sheet presentspertinenttechnical information foraparticulardeviceand isorganizedforquick access.This application reportdissects atypical Tl logicdata sheetanddescribesthe organization ofall data sheets.Typically, there are ten sections in TI logic data sheets:1.Summarydevicedescription2.Absolutemaximumratings3.Recommendedoperatingconditions4.Electrical characteristics5.Live-insertion specifications6.Timing requirements7.Switchingcharacteristics8.Noisecharacteristics9.Operatingcharacteristics10.Parametermeasurementinformation6Understanding and Interpreting Standard-LogicData Sheets
SZZA036B 6 Understanding and Interpreting Standard-Logic Data Sheets Introduction To assist component and system-design engineers in selecting Texas Instruments (TI) standard-logic products, this application report is a synopsis of the information available from a typical TI data sheet. Information includes a brief description of terms, definitions, and testing procedures currently used for commercial and military specifications. Symbols, terms, and definitions generally are in accordance with those currently agreed upon by the JEDEC Solid State Technology Association for use in the USA and by the International Electrotechnical Commission (IEC) for international use. This application report is organized into five main sections: 1. Introduction 2. Top-Level Look at the TI Data Sheet. Overall layout and component parts of a data sheet are explained. 3. Dissecting the TI Logic Data Sheet. JEDEC definition, the TI definition, an explanation, and, where possible, helpful hints are presented for each specification term commonly found in TI logic data sheets. 4. Logic Compatibility. Information in TI logic data sheets for determining the interface compatibility between different logic families is explained. 5. End matter, including the Conclusion, Acknowledgments, and References sections. Top-Level Look at the TI Logic Data Sheet The TI logic data sheet presents pertinent technical information for a particular device and is organized for quick access. This application report dissects a typical TI logic data sheet and describes the organization of all data sheets. Typically, there are ten sections in TI logic data sheets: 1. Summary device description 2. Absolute maximum ratings 3. Recommended operating conditions 4. Electrical characteristics 5. Live-insertion specifications 6. Timing requirements 7. Switching characteristics 8. Noise characteristics 9. Operating characteristics 10. Parameter measurement information
iTEXASINSTRUMENTSSZZA036BSummary DeviceDescriptionThe first section of a data sheet contains all of thegeneral information about a device (seeFigure1).Thisinformationincludes:1.Title,literaturenumber,anddatesoforiginationand revision,asapplicable2.Description of themain features andbenefits ofthedevice,alsoknownas features bullets3.FPackageoptionsandpinouts4.Description5.BGApackagingtop-view illustrationandterminalassignmentstable,ifapplicable(notillustrated in Figure 1)6.Orderinginformation7.Functiontable8.Logic diagram (positive logic)9.FProduct-development-stagenote7UnderstandingandInterpretingStandard-LogicDataSheets
SZZA036B Understanding and Interpreting Standard-Logic Data Sheets 7 Summary Device Description The first section of a data sheet contains all of the general information about a device (see Figure 1). This information includes: 1. Title, literature number, and dates of origination and revision, as applicable 2. Description of the main features and benefits of the device, also known as features bullets 3. Package options and pinouts 4. Description 5. BGA packaging top-view illustration and terminal assignments table, if applicable (not illustrated in Figure 1) 6. Ordering information 7. Function table 8. Logic diagram (positive logic) 9. Product-development-stage note
TEXASSZZA036BINSTRUMENTSSN74ALVC00QUADRUPLE2-INPUTPOSITIVE-NANDGATESCES115D-VISEDMARCH2002.Latch-UpPerformanceExceeds250mAPerD,DGV,NS,ORPW PACKAGE(TOPVIEW)JESD17ESDProtectlonExceedsJESD221Ad,14pVcc-2000-V Human-Body Model (A114-A)180213b4B200-V Machine Model (A115-A)1Y9312j4A104Y2A4description28953B10bThis quadruple 2-input positive-NAND gate is2Y693A3YGNDdesigned for1.65-Vto 3.6-V Vcc operation.The SN74ALVC00performs theBoolean functionY-A.BorY-A+Binpositive logic.ORDERINGINFORMATIONORDERABLETOP-SIDEPACKAGETTAMARKINGPARTNUMBERTubeSN74ALVCO0DSOIC-DALVC00Tape and reelSN74ALVC00DR640°C to 85°CSOPNSTape and reelSN74ALVC00NSRALVC00TSSOP-PWTape and reelSN74ALVC00PWRVA00TVSOP-DGVTape and reelSN74ALVC00DGVRVA00TPackage drawings, standard packing quantities,thermal data, symbolization, and PCB design guldlinesare available atwww.ti.com/sc/package.FUNCTIONTABLE(each gatoe) INPUTSOUTPUTYA0HHXHlogicdiagram,eachgate(positivelogic)BPleasebeawarethatanimportantnoticeconceming avallabilty,standard warranty,anduseincriticalapplicationsAATexas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.PROomabonCopyright 2002, Texas Instruments Incorporated9 TEXASafallINSTRUMENTSPOSTOFFICEBOX655303DALLAS,TEXAS75265Figure1.ExampleofSummaryDeviceDescription8Understandingand InterpretingStandard-LogicDataSheets
SZZA036B 8 Understanding and Interpreting Standard-Logic Data Sheets 1 2 3 4 6 7 8 9 Figure 1. Example of Summary Device Description
iFXASINSTRUMENTSSZZA036BAbsoluteMaximumRatingsTheabsolute maximum ratings section (Figure2)specifies the stress levelsthat, if exceeded,maycausepermanentdamagetothedevice.However,thesearestressratingsonly,andfunctionaloperationofthedeviceattheseoranyotherconditionsbeyondthoseindicatedunderrecommendedoperatingconditionsisnotimplied.Also,exposuretoabsolute-maximum-ratedconditionsforextendedperiodsmayaffectdevicereliabilityAs Figure 2 indicates,there are two absolutemaximums that may be exceeded under certainconditions.Theinputandoutputvoltageratings,ViandVo,maybeexceedediftheinputandoutput maximum clamp-currentratings, lik and lok,are observed.absolutemaximumratings overoperatingfree-airtemperaturerange (unless otherwisenoted)t0.5Vto4.6VSupply voltage range,Vcc:..0.5Vto4.6vInputvoltagerange,V,(seeNote1):0.5Vto Vcc+0.5VOutputvoltagerange,Vo(seeNotes1and2):.50mAInputclampcurrent,lik(V,<O):-50mAOutputclampcurrent,lok(Vo<0):±50mAContinuousoutputcurrent,lo:.±100mAContinuouscurrentthroughVccorGND:86°C/WPackagethermal impedance,8JA(seeNote3):Dpackage127°C/WDGVpackage76°C/WNSpackage..113C/WPWpackage65℃Cto150℃Storagetemperaturerange,TstgStressesbeyondthoselistedunder'absolutemaximumratingsmaycausepermanentdamagetothedevice.Thesearestressratingsonly.ander"recommendedoperatingconditions"isnotfunctionaloperationof thedeviceatthese orany otherconditionsbeyond those indicatedunderuretoabsolute-ratedconditionsforextendedperiodsmayaffectdevicereliabilitymplied.ExpoThe inputnegative-voltageandoutputvoltageratingsmaybeexceeded ifthe inputandoutputcurrentratings areobservedNOTES:1.Thisvalueislimitedto4.6Vmaximun3.Thepackage thermal impedance iscalculated in accordance withJESD51-7.Figure2.ExampleofAbsoluteMaximumRatingsSectionHelpful Hint:All currentsaredefined withrespectto conventional currentflow intothe respectiveterminal ofthe integrated circuit. This means that any current that flows out of the respective terminal isconsideredtobeanegativequantityAllimitsaregiven accordingtotheabsolute-magnitudeconvention,withafewexceptions.Inthis convention,maximum refers to the greater magnitude limit ofa range of like-signed values;iftherangeincludesbothpositiveandnegativevalues,bothlimitvaluesaremaximums.Minimum referstothe smallermagnitudelimit ofa rangeof like-signedvalues;iftherangeincludesbothpositiveandnegativevalues,theminimumisimplicitlyzero.ThemostcommonexceptionstotheuseoftheabsolutemagnitudeconventionaretemperatureandlogiclevelsHerezerodoesnotrepresenttheleast-possiblequantity,sothealgebraicconventioniscommonlyaccepted.Inthiscase,maximumreferstothemost-positivevalueRecommendedOperatingConditionsTherecommendedoperating conditions section of thedata sheet sets the conditions over whichTexasInstrumentsspecifiesdeviceoperation(seeFigure3).Thesearetheconditionsthattheapplicationcircuitshouldprovidetothedeviceforittofunctionasintended.Thelimitsforitemsthat appear in this section are used as test conditions for the limits that appear in the electricalcharacteristics,timingrequirements,switchingcharacteristics,andoperatingconditionssections9Understanding and Interpreting Standard-Logic Data Sheets
SZZA036B Understanding and Interpreting Standard-Logic Data Sheets 9 Absolute Maximum Ratings The absolute maximum ratings section (Figure 2) specifies the stress levels that, if exceeded, may cause permanent damage to the device. However, these are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Also, exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. As Figure 2 indicates, there are two absolute maximums that may be exceeded under certain conditions. The input and output voltage ratings, VI and VO, may be exceeded if the input and output maximum clamp-current ratings, IIK and IOK, are observed. Figure 2. Example of Absolute Maximum Ratings Section Helpful Hint: All currents are defined with respect to conventional current flow into the respective terminal of the integrated circuit. This means that any current that flows out of the respective terminal is considered to be a negative quantity. All limits are given according to the absolute-magnitude convention, with a few exceptions. In this convention, maximum refers to the greater magnitude limit of a range of like-signed values; if the range includes both positive and negative values, both limit values are maximums. Minimum refers to the smaller magnitude limit of a range of like-signed values; if the range includes both positive and negative values, the minimum is implicitly zero. The most common exceptions to the use of the absolute magnitude convention are temperature and logic levels. Here, zero does not represent the least-possible quantity, so the algebraic convention is commonly accepted. In this case, maximum refers to the most-positive value. Recommended Operating Conditions The recommended operating conditions section of the data sheet sets the conditions over which Texas Instruments specifies device operation (see Figure 3). These are the conditions that the application circuit should provide to the device for it to function as intended. The limits for items that appear in this section are used as test conditions for the limits that appear in the electrical characteristics, timing requirements, switching characteristics, and operating conditions sections
iTEXASINSTRUMENTSSZZA036Brecommendedoperatingconditions(seeNote4)SN54LVTH16646SN74LVTH16646UNITMINMINMAXMAX2.73.62.73.6VVccSupply voltage22vVIHHigh-level input voltageAvVIL0.80.8Low-level input voltageVi5.55.5vAInput voltage-24-32mALOHHigh-level output currentA4864mALoLLow-leveloutput current010A/AV10ns/VInput transition rise or fall rateOutputsenabledQ200200usVA/AVCCPower-up ramp rateTA551254085°℃Operatingfree-airtemperatureNOTE 1:All unusedcontrol inputs ofthedevice must be held at Vcc or GNDto ensure proper deviceoperation.Referto the Tlapplication report,ImplicationsofSloworFloatingCMOSInputs,literaturenumberSCBA004.Figure3.ExampleRecommendedOperatingConditionsSectionElectricalCharacteristicsThe electrical characteristics over recommended free-air temperature range table, also known intheindustryasthedctable,providesthespecifiedelectrical-characteristiclimitsofthedevicewhen tested underthe conditions in therecommendedoperating conditionstable,as givenspecificallyforeachparameter(seeFigure4)Helpful Hint:Althoughsomeparameters,suchasC,andCio,canbetestedwithanacsignal,sometimestheelectricalcharacteristicstableiscalledthedcsection.10UnderstandingandInterpretingStandard-LogicDataSheets
SZZA036B 10 Understanding and Interpreting Standard-Logic Data Sheets recommended operating conditions (see Note 4) SN54LVTH16646 SN74LVTH16646 UNIT MIN MAX MIN MAX VCC Supply voltage 2.7 3.6 2.7 3.6 V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0.8 0.8 V VI Input voltage 5.5 5.5 V IOH High-level output current –24 –32 mA IOL Low-level output current 48 64 mA ∆t/∆v Input transition rise or fall rate Outputs enabled 10 10 ns/V ∆t/∆VCC Power-up ramp rate 200 200 µs/V TA Operating free-air temperature –55 125 –40 85 °C NOTE 1: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. Figure 3. Example Recommended Operating Conditions Section Electrical Characteristics The electrical characteristics over recommended free-air temperature range table, also known in the industry as the dc table, provides the specified electrical-characteristic limits of the device when tested under the conditions in the recommended operating conditions table, as given specifically for each parameter (see Figure 4). Helpful Hint: Although some parameters, such as Ci and Cio, can be tested with an ac signal, sometimes the electrical characteristics table is called the dc section