Interconnect Parasitic Extraction Speaker: Wenjian yu Tsinghua University, Beijing, China Thanks to J. White, A Nardi, W. Kao, L. T Pileggi, Zhenhai zhu
Interconnect Parasitic Extraction Speaker: Wenjian Yu Tsinghua University, Beijing, China Thanks to J. White, A. Nardi, W. Kao, L. T. Pileggi, Zhenhai Zhu
Outline Introduction to parasitic extraction Resistance extraction Capacitance extraction a Inductance and impedance(RLC) extraction
2 Outline ◼ Introduction to parasitic extraction ◼ Resistance extraction ◼ Capacitance extraction ◼ Inductance and impedance (RLC) extraction
Introduction to Parasitic Extraction
3 Introduction to Parasitic Extraction
Introduction a Interconnect: conductive path a Ideally: wire only connects functional elements (devices, gates, blocks,.and does not affect design performance a This assumption was approximately true for large?design, it is unacceptable for DSM designs Slides courtesy A Nardi, UC Berkeley
4 Introduction ◼ Interconnect: conductive path ◼ Ideally: wire only connects functional elements (devices, gates, blocks, …) and does not affect design performance ◼ This assumption was approximately true for “large” design, it is unacceptable for DSM designs Slides courtesy A. Nardi, UC Berkeley
Introduction ■ Real wire has: 口 Resistance 口 Capacitance 口| nductance a Therefore wiring forms a complex geometry that introduces capacitive, resistive and inductive parasiticS. Effects a Impact on delay, energy consumption, power distribution a Introduction of noise sources, which affects reliability To evaluate the effect of interconnects on design performance we have to model them Slides courtesy A Nardi, UC Berkeley
5 Introduction ◼ Real wire has: Resistance Capacitance Inductance ◼ Therefore wiring forms a complex geometry that introduces capacitive, resistive and inductive parasitics. Effects: Impact on delay, energy consumption, power distribution Introduction of noise sources, which affects reliability To evaluate the effect of interconnects on design performance we have to model them Slides courtesy A. Nardi, UC Berkeley