(a (311) 2.49X nm High-resolution transmission (b) electron micrographs of (a)y-Fe2O3 and (b)a-Fe2O3, (104) indicating the lattice fringes. 2.71A nm PDF文件使用"pdfFactory”试用版本创建l.fineprint.cn
High-resolution transmission electron micrographs of (a)g-Fe2O3 and (b) a-Fe2O3 , indicating the lattice fringes. PDF 文件使用 "pdfFactory" 试用版本创建 Ìwww.fineprint.cn ÿÌ
320 300 互 The mean positron lifetime Tm Tm=(T1L1+T22+T31)/(I1+I2+I3) 280- 更 (5 260 夏 240 至 220- 互 更 2001 0 51015 2025 grain size(nm) PDF文件使用"pdfFactory”试用版本创建w.fineprint.cn
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PHYSICAL REVIEW B 71.024115 (2005) Positron annihilation studies of some anomalous features of NiFe2O nanocrystals grown in SiOz S.Chakraverty,Subarna Mitra.and K.Mandalt C.K.Majumdar Laboratory.S.N.Bose National Centre for Basic Sciences,Block JD.Sector III.Salt Lake,Kolkata 700098.India P.M.G.Nambissans Nuclear an 064.India TABLE I.The temperature and duration of heat treatment used for growing NiFe2O nanoparticles of different sizes (as obtained Deparment of Ply from XRD)in the SiO,matrix.The lattice parameter obtained for ata 700009.India (Re the different samples are also given. 5) Duration of Temperature annealing Grain size Lattice constant (K) (h) (nm) (A) 973 2 3.5 8.16 1073 1 4.8 8.19 1173 1 5.6 8.22 1273 2 6.8 8.25 1273 5 15.0 8.26 1273 24 25.0 8.27 1273 98 40.0 8.28 PDF文件使用"pdfFactory”试用版本创建w.fineprint.cn
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TABLE II.Positron lifetimes and their intensities in samples of NiFe2O4 nanocrystals of different mean grain sizes and grown in SiO2.The values obtained for the reference SiO2 are also presented. Typical errors in the lifetimes and intensities are 2 ps,5 ps,0.8 ns, 2%,2%,and 0.1-1.0%,respectively. Grain size (nm) T(ps) T2 (ps) 3(ns) I1(%) 12(%) 13(%) 3.5 142 432 1.29 52.0 45.1 2.9 4.8 133 406 1.08 50.6 45.2 4.2 5.6 131 392 1.13 50.8 46.2 3.0 6.8 143 420 1.43 56.1 41.7 2.2 15.0 139 416 1.50 54.0 43.3 2.7 25.0 137 400 1.76 55.8 38.5 5.7 40.0 133 400 1.64 51.5 38.9 9.6 SiO2 116 370 1.62 50.1 27.2 22.7 PDF文件使用"pdfFactory”试用版本创建w.fineprint.cn
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JOURNAL OF APPLIED PHYSICS 97.014301 (2005) Positron annihilation lifetime and coincidence-gated Doppler broadening studies of FeS2 nanostructures S.Kar and S.Chaudhuri Department of Materials Science,Indian Association for the Cultivation of Science,Jadaypur. Kolkata 700032.India TABLE I.Positron lifetimes and intensities in the different samples of FeS studied in this work.The typical errors inandare2 ps.4ps.and 0.08ns and in and are 1.7 1.7%and 0.05%,respectively. Sample description (s) (ps) 3(s) 1%) 上(ps) 13% T (ps) Bulk 132 296 1.000 46.6 52.8 0.6 224 Nanogranular sample 141 322 1.292 45.1 54.2 0.7 247 Nanoribbons 122 324 1.046 36.4 61.4 2.2 266 Oxidized nanoribbons 186 355 2.120 50.8 48.9 .3 274 Nanorods 135 340 1.260 37.4 614 1.2 274 Nanowires+nanotubes 149 374 1.396 4.0 50.0 6.0 336 PDF文件使用"pdfFactory”试用版本创建w.fineprint.cn
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