RAE CEMA RFA ZOOM LENS SAMPLE ●● 美国Brandeis大学慢正电子谱仪和球形 LEED-LEPD谱仪。B-正电子源，C-90园柱 形镜，D-慢化和加亮，E-样品和衍射谱仪
㕢 Brandeis ᄺ᜶ℷ⬉ᄤ䈅Ҿ⧗ᔶ LEED-LEPD䈅ҾDŽB-ℷ⬉ᄤ⑤ ˈC-90ು᷅ ᔶ䬰ˈD-᜶࣪ࡴ҂ˈE-ḋક㸡ᇘ䈅ҾDŽ
除了Brandeis大学的工作外，最近美国 Brookhaven实验室和BelI实验室及其它研究中 心也已经开始发展LEPD测量技术。 VIEW PORT AES AND LEED RESIDUAL GAS ANALYZER LENS SECTION 3 LENS LENS OF BEEF AND E.G SECTION 2 SECTION I SAMPLE OF BEEF OF BEEF TO VACUUM PUMP SPUTTER ION GUN CEMA WITH GRIDS TO VACUUM AND RESISTIVE ANODE PUMP HEATING ELECTRON GUN VIEW PORT
䰸њBrandeis ᄺⱘᎹˈ᳔䖥㕢 Brookhavenᅲ偠ᅸ Bellᅲ偠ᅸঞ݊ᅗⷨおЁ ᖗгᏆ㒣ᓔྟথሩLEPD⌟䞣ᡔᴃDŽ
Brightness-enhanced A type intensity 1-3x106/s positrons is obtained by using 0.5Ci source. This beam still is low optical brightness: R 02D2E Because a large D (10mm).The OD product of a typical beam is at least 20 times too large for the LEPD experiment
Brightness-enhanced A type intensity 1-3×106/s positrons is obtained by using 0.5Ci source. This beam still is low optical brightness: D E I R 2 2 θ = Because a large D (10mm). The θD product of a typical beam is at least 20 times too large for the LEPD experiment
对大部分的慢化体，研究表明，正电子发 射动能近似等于正电子负功函数+，对一些 特别的晶体和表面条件，其能量半高宽为 70meV,与Φ，无关.对一个平板型的慢化体，其 发射角为： 1/2 0e=2 0.035 rad= 20 中+ deg Ni:Φ，=1.5eV,17° W:φt=3eV,12°
ᇍ䚼ߚⱘ᜶࣪ⷨ ,ԧお㸼ᯢ, ℷ⬉ᄤথ ᇘࡼ㛑䖥ԐㄝѢℷ⬉ᄤ䋳ߑࡳ᭄φ+, ᇍϔѯ ⡍߿ⱘԧ㸼䴶ᴵӊ,݊㛑䞣ञ催ᆑЎ 70meV, Ϣφ+᮴݇. ᇍϔϾᑇᵓൟⱘ᜶࣪݊,ԧ থᇘ㾦Ў: Ni: φ+ = 1.5eV, 17° W: φ+ = 3 eV, 12°
Brightness-enhanced electrostatically focused (BEEF) SOFT IRON I- REMOD I (RM I) TARGET -LENS SECTION 2 FIRST LENS SET TRIPLET LENS CEMA WITH GRIDS SECTION I AND RESISTIVE ANODE LENS TWO PAIRS OF SECTION 3 DEFLECTION PLATES SOFT FINAL LENS GRID IRON 2 SET TRIPLET SOURCE REMOD 2(CAN BE REPLACED MODERATOR (RM 2)BY ELECTRON GUN)
B r i g h t n e s s - e n h a n c e d e l e c t r o s t a t i c a l l y fo c u s e d ( B E E F )