Kikuchi Patterns in TEM incident incident ↓ TEM incident electron beam EBSD phosphor electron beam Kossel- electron beam screen cones diffuse scattering sample sample Kossel- lattice cones planes(hkl) tilted 90°.0 lattice sample planes(hkl) ]2 Kikuchi-lines lattice planes (hkl) Kikuchi-lines excess-defect- Kikuchi-line
Kikuchi Patterns in TEM & EBSD
17 Opening cone angles are close to 180 because of the short A of high energy electrons. e Phosphor screen Trace of diffracting plane Diffracting lattice plane Cones of Diffracted EBSD band edges electrons
Opening cone angles are close to 180 because of the short λ of high energy electrons. 17
Electron Back-Scattered Pattern Electron Back-Scattered Diffraction ·电子背散射衍射技术简称EBSP或EBSD 。其他的有：BKD,OIM.. 装配在SEM上使用，一种显微表征技术 通过自动标定背散射衍射花样，测定大块样品表面（通常矩 形区域内)的晶体微区取向
• Electron Back-Scattered Pattern • Electron Back-Scattered Diffraction • 电子背散射衍射技术简称EBSP或EBSD • 其他的有：BKD，OIM…… • 装配在SEM上使用，一种显微表征技术 • 通过自动标定背散射衍射花样，测定大块样品表面（通常矩 形区域内）的晶体微区取向 EBSD的术语和定义
程区上 时环
EBSD硬件
