Prototyping Analog Circuits Evaluation Boards Noise Reduction and Filtering for Switching Power Supplies Low Dropout References and Regulators EMI/RFI Considerations Sensors and Cable Shielding

High Speed Op Amp Distortion High Frequency Two-Tone Generation Using Spectrum Analyzers in High Frequency Low Distortion Measurements Measuring ADC Distortion using FFTs FFT Testing

ANALOG INTEGRATED CIRCUITS Amplifier Input Stage Overvoltage Amplifier Output Voltage Phase Reversal Understanding and Protecting Integrated Circuits from Electrostatic Discharge (ESD)

Data Acquisition System Considerations Multiplexing Filtering Considerations for Data Acquisition Systems SHA and ADC Settling Time Requirements in Multiplexed Applications Complete Data Acquisition Systems on a Chip Multiplexing into Sigma-Delta ADCs Simultaneous Sampling Systems

Fundamentals of Undersampling Increasing ADC SFDR and ENOB using External SHAs Use of Dither Signals to Increase ADC Dynamic Range Effect of ADC Linearity and Resolution on SFDR and Noise in Digital Spectral Analysis Applications Future Trends in Undersampling ADCs

ADC Dynamic Considerations Selecting the Drive Amplifier Based on ADC Dynamic Performance Driving Flash Converters Driving the AD9050 Single-Supply ADC Driving ADCs with Switched Capacitor Inputs Gain Setting and Level Shifting External Reference Voltage Generation ADC Input Protection and Clamping

HIGH RESOLUTION SIGNAL CONDITIONING ADCs Walt Kester, James Bryant, Joe Buxton The trend in ADCs and DACs is toward higher speeds and higher resolutions at reduced power levels. Modern data converters generally operate

Driving Capacitive Loads Cable Driving Single-Supply Considerations Application Circuits

Rail-to-Rail Input Stages Rail-to-Rail Output Stages Single-Supply Instrumentation Amplifiers

一．基本觀念： （1）電基本上可分為 AC（交流）與 DC（直流）兩種 。 （a）AC（大陸為 50HZ）又有三相與單相之分： 三相：220V、380V